Their effect on the adhesion between a vacuum deposited TiO2 coating and the substrate were also assessed by cross-cut test. The treatments consisted of ultraviolet-ozone, sputter etching and oxygen plasma. In this work, we investigated the effect of three surface treatments on the properties of polymethyl methacrylate (PMMA) and polycarbonate (PC). Error bars represent the standard deviation (c, d). The probe positions are denoted on the high-angle annular dark field scanning transmission electron microscopy images.

Red lines are the raw data, and black lines are their averages over 20 neighboring points. e The electron energy loss spectroscopy data collected from different positions at 5 nm intervals across the Cu–PI interface for the unirradiated (left) and irradiated (right) samples.

The relative value of work of adhesion (W) between irradiated and unirradiated samples was then calculated, showing better adhesion for the irradiated sample. d The critical normal force (Lcr) extracted from a nanoscratch test measuring the normal force at the Cu–PI interface at the onset of delamination.

Inverse pole figure maps and the inset of (111) pole figures of (a) unirradiated and (b) e-beam-irradiated Cu thin films obtained from ASTARTM analysis and (c) the grain-size distribution in each case. Investigation of e-beam induced changes in the Cu film–PI system.

Tew 2016 license crack